YG

Yoshiro Goto

AD Advantest: 1 patents #17 of 62Top 30%
Fujitsu Limited: 1 patents #640 of 2,531Top 30%
NE Nec: 1 patents #225 of 1,182Top 20%
Overall (1997): #19,252 of 185,788Top 15%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5677635 Voltage and displacement measuring apparatus and probe Akira Fujii, Yoko Sato, Soichi Hama, Kazuyuki Ozaki, Yasutoshi Umehara +1 more 1997-10-14
5614432 Method for manufacturing LDD type MIS device 1997-03-25