IT

Isamu Takano

NE Nec: 2 patents #67 of 1,182Top 6%
Overall (1997): #37,398 of 185,788Top 25%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5701087 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test — 1997-12-23
5604447 Prescaler IC testing method and test probe card — 1997-02-18