AK

Akihiko Kagami

NE Nec: 1 patents #225 of 1,182Top 20%
Overall (1997): #180,037 of 185,788Top 100%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5629944 Test mode setting circuit of test circuit for semiconductor memory — 1997-05-13