JP

Jaime Poris

NI Nanometrics Incorporated: 1 patents #1 of 1Top 100%
📍 Portola Valley, CA: #25 of 57 inventorsTop 45%
🗺 California: #4,598 of 17,285 inventorsTop 30%
Overall (1997): #134,686 of 185,788Top 75%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5625170 Precision weighing to monitor the thickness and uniformity of deposited or etched thin film 1997-04-29