Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5694364 | Semiconductor integrated circuit device having a test mode for reliability evaluation | Masaki Tsukude, Kazutami Arimoto | 1997-12-02 |
FM
Fukashi Morishita
Overall (1997): #151,294 of 185,788Top 85%
1
Patents 1997