Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5681779 | Method of doping metal layers for electromigration resistance | Nicholas F. Pasch | 1997-10-28 |
| 5614437 | Method for fabricating reliable metallization with Ta-Si-N barrier for semiconductors | — | 1997-03-25 |