TN

Teruhiko Nagashima

AD Advantest: 2 patents #6 of 62Top 10%
Overall (1997): #22,247 of 185,788Top 15%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5696550 Image quality inspection system Hiroyuki Aoki, Yoshihisa Matsumura, Hiroto Satoh, Masaki Hayashi 1997-12-09
5686959 Image quality inspection system and image synthesis method Masaki Hayashi, Hiroto Satoh, Hiroyuki Aoki 1997-11-11