Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606263 | Probe method for measuring part to be measured by use thereof and electrical circuit member | Tetsuo Yoshizawa, Hideyuki Nishida, Hiroshi Kondo, Takashi Sakaki, Yasuteru Ichida +1 more | 1997-02-25 |