YA

Yasuhiro Andoh

NE Nec: 1 patents #225 of 1,182Top 20%
Overall (1997): #57,976 of 185,788Top 35%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5617428 Scan test circuit and semiconductor integrated circuit device with scan test circuit 1997-04-01