Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5701306 | Semiconductor integrated circuit which can be tested by an LSI tester having a reduced number of pins | — | 1997-12-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5701306 | Semiconductor integrated circuit which can be tested by an LSI tester having a reduced number of pins | — | 1997-12-23 |