Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5634001 | Method to calculate hot-electron test voltage differential for assessing microprocessor reliability | Steven W. Mittl, David E. Moran, Kimball M. Watson | 1997-05-27 |
TO
Timothy J. O'Gorman
Overall (1997): #66,884 of 185,788Top 40%
1
Patents 1997