Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5675261 | Probe card locking device of a probe station for testing a semiconductor wafer | — | 1997-10-07 |
| 5644246 | Probe card locking device of a semiconductor wafer probe station | Ung-gi Park, Wha Young KIM | 1997-07-01 |