Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5596537 | Semiconductor device test circuit having test enable circuitry and test mode-entry circuitry | Shunichi Sukegawa, Hiromi Matsuura, Masaya Muranaka | 1997-01-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5596537 | Semiconductor device test circuit having test enable circuitry and test mode-entry circuitry | Shunichi Sukegawa, Hiromi Matsuura, Masaya Muranaka | 1997-01-21 |