Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5641960 | Circuit pattern inspecting device and method and circuit pattern arrangement suitable for the method | Masafumi Asai | 1997-06-24 |
| 5600734 | Electron beam tester | Hironori Teguri, Akio Ito | 1997-02-04 |