TT

Tohru Tsujide

NE Nec: 1 patents #225 of 1,182Top 20%
Overall (1997): #64,674 of 185,788Top 35%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5703492 System and method for fault analysis of semiconductor integrated circuit Toyokazu Nakamura, Yasuko Hanagama, Kenji Morohashi 1997-12-30