Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5624190 | Method and apparatus for measuring the temperature of an object, in particular a semiconductor, by ellipsometry | Jacques Joseph, Yao Zhi Hu | 1997-04-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5624190 | Method and apparatus for measuring the temperature of an object, in particular a semiconductor, by ellipsometry | Jacques Joseph, Yao Zhi Hu | 1997-04-29 |