JR

Jonathan K. Riek

NC National Science Council: 1 patents #16 of 96Top 20%
🗺 New York: #1,999 of 7,187 inventorsTop 30%
Overall (1997): #126,522 of 185,788Top 70%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5602654 Contour-sensitive, single-field deinterlacing method Andrew J. Patti, M. Ibrahim Sezan 1997-02-11