Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5652376 | Method of measuring yield stress | David C. Deleeuw | 1997-07-29 |
NL
Neal R. Langley
Overall (1997): #99,306 of 185,788Top 55%
1
Patents 1997