Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606168 | In situ tensile testing machine and sample for a scanning electron microscope | Jacques Fryet, Patrick Viaris De Lesegno | 1997-02-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606168 | In situ tensile testing machine and sample for a scanning electron microscope | Jacques Fryet, Patrick Viaris De Lesegno | 1997-02-25 |