Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5642298 | Wafer testing and self-calibration system | Roy E. Mallory, Noel S. Poduje, Alexander Belyaev, Peter A. Harvey, Richard Scott Smith | 1997-06-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5642298 | Wafer testing and self-calibration system | Roy E. Mallory, Noel S. Poduje, Alexander Belyaev, Peter A. Harvey, Richard Scott Smith | 1997-06-24 |