Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5699447 | Two-phase optical inspection method and apparatus for defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 1997-12-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5699447 | Two-phase optical inspection method and apparatus for defect detection | David Alumot, Gad Neumann, Ehud Tirosh | 1997-12-16 |