MA

Meir Aloni

OI Orbot Instruments: 2 patents #1 of 12Top 9%
Overall (1997): #30,225 of 185,788Top 20%
2
Patents 1997

Issued Patents 1997

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5619429 Apparatus and method for inspection of a patterned object by comparison thereof to a reference Amir Alon, Yair Eran, Itzhak Katz, Yigal Katzir, Gideon Rosenfeld 1997-04-08
5619588 Apparatus and method for comparing and aligning two digital representations of an image Joel Yolles, Yair Eran, Haim Kaplan 1997-04-08