Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5661556 | System for measuring the total integrated scatter of a surface | Tod F. Schiff | 1997-08-26 |
| 5625451 | Methods and apparatus for characterizing a surface | Tod F. Schiff | 1997-04-29 |