Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5670891 | Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same | Yung-Tao Lin, Ying Shiau | 1997-09-23 |
| 5598341 | Real-time in-line defect disposition and yield forecasting system | Thao H. T. Vo, Siu May Ho, Ying Shiau, Yeng-Kaung Peng, Yung-Tao Lin | 1997-01-28 |