Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5617431 | Method and apparatus to reuse existing test patterns to test a single integrated circuit containing previously existing cores | Harikumar B. Nair | 1997-04-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5617431 | Method and apparatus to reuse existing test patterns to test a single integrated circuit containing previously existing cores | Harikumar B. Nair | 1997-04-01 |