JL

John K. Lowell

AM AMD: 1 patents #171 of 389Top 45%
📍 Round Rock, TX: #17 of 70 inventorsTop 25%
🗺 Texas: #1,517 of 5,943 inventorsTop 30%
Overall (1997): #127,793 of 185,788Top 70%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5657363 Method and apparatus for determining the thickness and elemental composition of a thin film using radioisotopic X-ray fluorescence (RXRF) Tim Z. Hossain 1997-08-12