Issued Patents 1994
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5361312 | Method and apparatus for phase evaluation of pattern images used in optical measurement | — | 1994-11-01 |
| 5357341 | Method for evaluating interferograms and interferometer therefor | Karl-Heinz Schuster, Klaus Freischlad | 1994-10-18 |
| 5343294 | Method for analyzing periodic brightness patterns | Albrecht Hof | 1994-08-30 |