Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5359285 | Method and apparatus for varying temperature and electronic load conditions of a semiconductor device in a burn-in test chamber while performing a burn-in test | Masanori Nishiguchi | 1994-10-25 |
| 5327075 | Burn-in apparatus and method for semiconductor devices | Masanori Nishiguchi | 1994-07-05 |