Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5336886 | Apparatus for measuring a diffraction pattern of electron beams having only elastic scattering electrons | — | 1994-08-09 |
| 5319695 | Multilayer film reflector for soft X-rays | Izumi Kataoka | 1994-06-07 |