Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5335066 | Measuring method for ellipsometric parameter and ellipsometer | Takeo Yamada, Takahiko Oshige | 1994-08-02 |
| 5311285 | Measuring method for ellipsometric parameter and ellipsometer | Takahiko Oshige, Takeo Yamada | 1994-05-10 |