Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5338932 | Method and apparatus for measuring the topography of a semiconductor device | Juan P. Carrejo | 1994-08-16 |
| 5326971 | Transmission electron microscope environmental specimen holder | Juan P. Carrejo | 1994-07-05 |