RC

Randal W. Chance

Micron: 1 patents #69 of 158Top 45%
📍 Boise, ID: #59 of 164 inventorsTop 40%
🗺 Idaho: #99 of 378 inventorsTop 30%
Overall (1994): #80,844 of 165,921Top 50%
1
Patents 1994

Issued Patents 1994

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5328810 Method for reducing, by a factor or 2.sup.-N, the minimum masking pitch of a photolithographic process Tyler Lowrey, David A. Cathey 1994-07-12