Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5355212 | Process for inspecting patterned wafers | Keith Wells, Hung Nguyen, Ralph Johnson | 1994-10-11 |
| 5276498 | Adaptive spatial filter for surface inspection | Lee K. Galbraith, John L. Vaught, Ralph C. Wolf, Armand P. Neukermans | 1994-01-04 |