WD

William I. Doxsey

IBM: 1 patents #741 of 3,003Top 25%
📍 Poughkeepsie, NY: #45 of 151 inventorsTop 30%
🗺 New York: #1,860 of 7,004 inventorsTop 30%
Overall (1994): #164,801 of 165,921Top 100%
1
Patents 1994

Issued Patents 1994

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5317338 Visual measurement technique and test pattern for aperture offsets in photoplotters John J. Masten, Jr., deceased, Richard M. Schroedl, Donald G. Will 1994-05-31