Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5375091 | Method and apparatus for memory dynamic burn-in and test | Bernd Koenemann, William J. Scarpero, Jr., Philip G. Shephard, III, Kenneth D. Wagner, Gulsun Yasar | 1994-12-20 |
| 5278842 | Delay test coverage enhancement for logic circuitry employing level sensitive scan design | Jacob Savir | 1994-01-11 |