RF

Randall M. Feenstra

IBM: 1 patents #741 of 3,003Top 25%
📍 Tarrytown, NY: #9 of 24 inventorsTop 40%
🗺 New York: #1,860 of 7,004 inventorsTop 30%
Overall (1994): #80,701 of 165,921Top 50%
1
Patents 1994

Issued Patents 1994

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5337015 In-situ endpoint detection method and apparatus for chemical-mechanical polishing using low amplitude input voltage Naftali E. Lustig, William L. Guthrie 1994-08-09