Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5345080 | Method of observing electron microscopic images and an apparatus for carrying out of the same | Yusuke Yajima, Hiroyuki Shinada | 1994-09-06 |
| 5298747 | Scanning interference electron microscopy | Yusuke Yajima, Masatoshi Takeshita, Toshio Kobayashi | 1994-03-29 |