Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5293538 | Method and apparatus for the inspection of defects | Yukio Matsuyama, Hitoshi Kubota | 1994-03-08 |
| 5278012 | Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate | Chie Yamanaka, Toshiaki Ichinose, Takanori Ninomiya, Yasuo Nakagawa, Nobuyuki Akiyama | 1994-01-11 |