Issued Patents 1994
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5375473 | Semiconductor type differential pressure measurement apparatus and method for manufacturing the same | Kyoichi Ikeda, Tetsuya Watanabe, Takahiro Kudo, Kouji Nagai, Satoshi Fukuhara | 1994-12-27 |