Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5372645 | Method for determining thickness of chemical vapor deposited layers | Thomas R. Fnthony, James F. Fleischer | 1994-12-13 |
| 5300313 | Method for determining thickness of chemical vapor deposited layers | Thomas R. Anthony, James F. Fleischer | 1994-04-05 |