Issued Patents 1994
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5370842 | Sample measuring device and sample measuring system | Takeshi Miyazaki, Matsuomi Nishimura, Kazumi Tanaka, Toshikazu Ohnishi, Masanori Sakuranaga +3 more | 1994-12-06 |
| 5357108 | Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same | Yoshio Suzuki, Yutaka Hirai, Osamu Takamatsu, Masaru Nakayama, Yuji Kasanuki +2 more | 1994-10-18 |
| 5349858 | Angular acceleration sensor | Yutaka Hirai, Osamu Takamatsu, Masaru Nakayama, Hiroyasu Nose, Katsuhiko Shinjo +1 more | 1994-09-27 |
| 5344522 | Pattern forming process and process for preparing semiconductor device utilizing said pattern forming process | Toshiyuki Komatsu, Yasue Sato, Shinichi Kawate | 1994-09-06 |
| 5334835 | Probe drive mechanism and electronic device which uses the same | Masaru Nakayama, Osamu Takamatsu, Keisuke Yamamoto, Takehiko Kawasaki, Yasuhiro Shimada +1 more | 1994-08-02 |
| 5321685 | Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same | Hiroyasu Nose, Kunihiro Sakai, Toshimitsu Kawase, Toshihiko Miyazaki, Katsuhiko Shinjo +5 more | 1994-06-14 |
| 5317152 | Cantilever type probe, and scanning tunnel microscope and information processing apparatus employing the same | Osamu Takamatsu, Yutaka Hirai, Masaru Nakayama, Yuji Kasanuki, Yasuhiro Shimada | 1994-05-31 |
| 5313451 | Information recording/reproducing apparatus with STM cantilever probe having a strain gauge | Toshiyuki Komatsu | 1994-05-17 |