Issued Patents 1994
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5341314 | Method for generating a test to detect differences between integrated circuits | Robert Bencivenga, Scott A. Davidson | 1994-08-23 |
| 5338223 | Hybrid wafer probe | Livio R. Melatti | 1994-08-16 |
| 5332996 | Method and apparatus for all code testing | Miroslaw Guzinski, James L. Lewandowski, Shianling Wu | 1994-07-26 |