ZL

Zvi Landau

UT Upa Technology: 1 patents #1 of 5Top 20%
📍 Elmont, NY: #12 of 53 inventorsTop 25%
🗺 New York: #1,258 of 5,342 inventorsTop 25%
Overall (1989): #32,649 of 140,708Top 25%
1
Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4860329 X-ray fluorescence thickness measuring device Murray Weiser, William Silverman, Paul Finer, Cary Pincus 1989-08-22