MW

Murray Weiser

UT Upa Technology: 1 patents #1 of 5Top 20%
📍 Syosset, NY: #3 of 8 inventorsTop 40%
🗺 New York: #1,258 of 5,342 inventorsTop 25%
Overall (1989): #139,591 of 140,708Top 100%
1
Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4860329 X-ray fluorescence thickness measuring device William Silverman, Zvi Landau, Paul Finer, Cary Pincus 1989-08-22