Issued Patents 1989
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4884890 | Method for normalizing the detection signals of magnified images of fluorescing materials | — | 1989-12-05 |
| 4849694 | Thickness measurements of thin conductive films | — | 1989-07-18 |
| 4826321 | Thin dielectric film measuring system | Warren Lin | 1989-05-02 |