Warren Lin

NI Nanometrics Incorporated: 1 patents #2 of 2Top 100%

📍 Fremont, CA: #38 of 137 inventorsTop 30%

🗺 California: #2,144 of 10,592 inventorsTop 25%

Overall (1989): #45,706 of 140,708Top 35%

Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
4826321	Thin dielectric film measuring system	Vincent J. Coates	1989-05-02