Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4874240 | Characterization of semiconductor resist material during processing | Thiloma I. Perera, David W. Myers, Robert G. Ozarski, John F. Schipper, Raul V. Tan | 1989-10-17 |
| 4857738 | Absorption measurements of materials | David W. Myers, Robert G. Ozarski, Thiloma I. Perera, John F. Schipper, Raul V. Tan | 1989-08-15 |