Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4860227 | Circuit for measuring characteristics of a device under test | — | 1989-08-22 |
| 4833403 | Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal | Akira Hoshika, Kiyoyasu Hiwada | 1989-05-23 |