Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4833403 | Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal | Toshio Tamamura, Kiyoyasu Hiwada | 1989-05-23 |