Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4803734 | Method of and apparatus for detecting pattern defects | Hiroyuki Onishi, Tetsuo Sano, Tetsuo Hoki, Eiji Kodama, Ryuji Kitakado | 1989-02-07 |
| 4799175 | System for inspecting pattern defects of printed wiring boards | Tetsuo Sano, Tetsuo Hohki, Eiji Kodama, Takumi Yoshida, Masafumi Kawatani | 1989-01-17 |